TED (Tenders Electronic Daily)10d left · 7 Sept 2026
Netherlands – Microelectronic machinery and apparatus and microsystems – Metrology SEM+FIB system
Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
Est. value
—
Deadline
7 Sept 2026
Published
28 Jul 2026
Region
NLD
Description
The main purpose of this FIB/SEM equipment is to perform material milling (cutting), 3D characterization, and cross section analysis of epitaxially grown InP, InGaAs, InAlGaAs and InGaAsP layers on InP substrates. The structures may also contain polymer-based planarization layers, SiOx or SiNx dielectric layers and TiPtAu or NiGeAu metal layers. Levering van één SEM +FIB systeem
CPV codes
Microelectronic machinery and apparatus and microsystemsMiscellaneous evaluation or testing instruments
Source: View original notice
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